DigitalCommons@University of Nebraska - Lincoln - Gary Swift and Robert Katz: An Experimental Survey of Heavy Ion Induced Dielectric Rupture in Actel Field Programmable Gate Arrays (FPGAs)

Research Papers in Physics and Astronomy

Robert Katz Publications

Title

An Experimental Survey of Heavy Ion Induced Dielectric Rupture in Actel Field Programmable Gate Arrays (FPGAs)

Authors

Gary Swift, Jet Propulsion Laboratory, California Institute of Technology, Pasadena CA
Robert Katz, University of Nebraska - Lincoln

Document Type

Article

Date of this Version

6-1996

Comments

Published in IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOL. 43, NO 3, JUNE 1996.

Abstract

Irradiations and subsequent failure analyses were performed to investigate single event dielectric rupture (SEDR) in Actel FPGAs as a function of ion LET (linear energy transfer), angle, bias, temperature, feature size, and device type. The small cross sections imply acceptably low risk for most spacecraft uses.

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