Materials and Nanoscience, Nebraska Center for (NCMN)


Date of this Version



Published in Ultramicroscopy 110:4 (March 2010), pp. 297–304; doi: 10.1016/j.ultramic.2009.12.009 Copyright © 2009 Elsevier B.V. Used by permission.


A computer program for the simulation of polycrystalline electron diffraction patterns is described. PCED2.0, an upgraded version of the previous JECP/PCED, can be used as a teaching aid and research tool for phase identification, microstructure texture analysis, and phase fraction determination. In addition to kinematical theory for diffraction intensity calculation of polycrystalline samples, Blackman two-beam dynamical correction is included. March model is used for out-of-plane and in-plane texture simulation. A pseudo-Voigt function is used for the peak profile fitting of diffraction rings. User-friendly interface is improved in the handling of experimental diffraction data and the flexibility of indexing. Application of the program for the analysis of FePt thin films is given as an example.