Electrical & Computer Engineering, Department of


Date of this Version



Published in Journal of Applied Physics 64:10 (November 15, 1988), p. 5769. Copyrighted by The American Institute of Physics. Used by permission.


The purpose of this paper is twofold. First, we describe the adaptation of a variable angle spectroscopic ellipsometer (VASE) to magneto-optic measurements covering 3000–8000 Å, and 0 to ±8 kOe. Second, we describe application of VASE to determine Kerr rotation and ellipticity for a series of Dy/Co multilayers prepared by sputter deposition. We report spectroscopic ellipsometric and Kerr effect results for samples exhibiting perpendicular magnetic anisotropy, since these are relevant as magneto-optic recording media.