Discovery of Nanoscale Electric Field-Induced Phase Transitions in ZrO₂

Authors

Patrick D. Lomenzo, Technische Universität Dresden
Liam Collins, Oak Ridge National Laboratory
Richard Ganser, Munich University of Applied Sciences
Bohan Xu, Technische Universität Dresden
Roberto Guido, Technische Universität Dresden
Alexei Gruverman, University of Nebraska - LincolnFollow
Alfred Kersch, Munich University of Applied Sciences
Thomas Mikolajick, Technische Universität Dresden
Mikolajick Schroeder, Technische Universität Dresden

Document Type

Article

Date of this Version

5-17-2023

Citation

Adv. Funct. Mater. 2023, DOI: 10.1002/adfm.202303636.

Comments

Open access.

Abstract

The emergence of ferroelectric and antiferroelectric properties in the semiconductor industry’s most prominent high-k dielectrics, HfO₂ and ZrO₂, is leading to technology developments unanticipated a decade ago. Yet the failure to clearly distinguish ferroelectric from antiferroelectric behavior is impeding progress. Band-excitation piezoresponse force microscopy and molecular dynamics are used to elucidate the nanoscale electric field-induced phase transitions present in ZrO₂-based antiferroelectrics. Antiferroelectric ZrO2 is clearly distinguished from a closely resembling pinched La-doped HfO₂ ferroelectric. Crystalline grains in the range of 3 – 20 nm are imaged independently undergoing reversible electric field induced phase transitions. The electrically accessible nanoscale phase transitions discovered in this study open up an unprecedented paradigm for the development of new nanoelectronic devices.