Experimental evidence of strain relaxed domain structure in (100)/(001)-oriented epitaxial lead titanate thick films grown by metal organic chemical vapor deposition

Authors

Hiroshi Nakaki, Tokyo Institute of Technology, Yokohama, Japan
Yong Kwan Kim, Tokyo Institute of Technology, Yokohama, Japan
Shintaro Yokoyama, Tokyo Institute of Technology, Yokohama, Japan
Rikyu Ikariyama, Tokyo Institute of Technology, Yokohama, Japan
Hiroshi Funakubo, Tokyo Institute of Technology, Yokohama, Japan
S. K. Streiffer, Argonne National Laboratory, Argonne, Illinois
Ken Nishida, National Defense Academy, Japan
Keisuke Saito, Application Laboratory, Bruker AXS, 3-9-A Moriya-cho, Kanagawa-ku, Yokohama 221-0022, Japan
Alexei Gruverman, University of Nebraska-LincolnFollow

Date of this Version

January 2008

Comments

Published in JOURNAL OF APPLIED PHYSICS 104, 064121 (2008). Copyright © 2008 American Institute of Physics. Used by permission.

Abstract

Epitaxial (100)/(001)-oriented PbTiO₃ films with thickness of 2.8 μm were grown on Nb-doped (100) SrTiO₃ substrates by pulsed metal organic chemical vapor deposition. Complex domain structures consisting of c-domains (c1) and three types of a-domains (a1, a2, and a3) were observed by piezoresponse force microscopy in conjunction with high-resolution x-ray diffraction analysis. The obtained results suggest that (a2/a3) and (a1/c1) domain configurations represent mostly strain-relaxed structures. This conclusion is in good agreement with theoretical predictions made for thick films [Phys. State., Solidi 37, 329 (1976)].