Date of this Version
JOURNAL OF APPLIED PHYSICS 112, 052001 (2012); http://dx.doi.org/10.1063/1.4746078
Domain structures of epitaxial PbTiO3 films grown on (100)cSrRuO3//(100)SrTiO3 substrates by metalorganic chemical vapor deposition were investigated by x-ray diffraction (XRD) and piezoresponse force microscopy (PFM) techniques. It was found that with increasing film thickness, the domain structure changed from simple (001) polarization orientation to a complicated mixture of (001) and (100) orientations. PFM mappings showed that in the thicker films (~1100 nm), the zigzag (001)/(100) domain boundaries made an angle of approximately 87° instead of 90° typically observed in (001)/(100) domain patterns in thinner (<300 nm) films. Full-relaxed tilting angle θ1+ θ2+θ3=3.4° obtained from cross-sectional profile analysis of topological step-terrace structure was in good agreement with 3.4° and 3.6° angle values obtained from XRD measurements and theoretical prediction, respectively.