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The issues of sign reversal of the Hall voltage and scaling between longitudinal (ρχχ) and Hall (ρχy) resistivities are studied in Tl2Ba2Ca2Cu3O10 films in which the vortex dynamics is drastically changed by flux pinning at heavy-ion-irradiation–induced linear defects. While the sign anomaly diminishes with increasing defect concentration, the power law ρχy∼ρχχ β , β=1.85±0.1, holds even after irradiation. This result shows that the scaling is a universal feature of the mixed state in this system. The sign anomaly, on the other hand, is not consistent with a model that invokes pinning-induced backflow in the vortex core as the mechanism for this effect.