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Optical properties OS spin-cast chitosan films have been determined in the infrared, visible, and ultraviolet region or the spectrum ~tsing spectroscopic ellipsometry. Optical constants for the Vvis-near IR spectra from 130 to 1700 nm were determined using Cauchy dispersion forms com-bined with Lorentzian oscillator models in the absorptive shorler wavelength regions. Infrared ndex of refraction and extinction coefficients from 750 to 4000cm-' were determined using ellip-sometric data fits to dispersion models based on harmonic oscillators. This modeling determined that optical onisotropy was present and measurable over all wavelength regions of ellipsomctric data. To obtain information on the micro- and nano-scale surface structure, tapping mode atomic force microscopy (AFM) imaging was employed to determine morphology and roughness infor-mation of dry spin-cast chitosan films.