Computer Science and Engineering, Department of


Date of this Version



Published in IEEE TRANSACTIONS ON COMPUTERS, VOL. c-33, NO. 10, OCTOBER 1984, pp. 934-937. doi: 10.1109/TC.1984.1676357 Copyright 1994 IEEE. Used by permission.


Earlier approaches to random compact testing use a random pattern generator which depends on the combinational function under test and a circuit signature which remains the same independent of the circuit. In this correspondence we analyze the performance of a new scheme in which the pattern generator is simple and independent of the function being tested but the circuit signature is chosen to be a coefficient from the Rademacher-Walsh (RW) spectrum of the function under test. The analysis provides guidelines for choosing an RW coefficient, a test length, and an error tolerance so as to minimize the probabilities of rejecting a good unit or accepting a faulty one.