Surface-related breakdown in silicon: Imaging of current filaments in long p⁺-n^--n⁺ structures

Authors

B. J. Hankla, University of Nebraska - Lincoln
P. F. Williams, University of Nebraska - LincolnFollow
G. A. Frecks, University of Nebraska - Lincoln
F. E. Peterkin, Naval Surface Warfare Center, Code B, Dahlgren, VA

Document Type

Article

Date of this Version

December 1995

Comments

Published in Appl. Phys. Lett. 67 (26), 25 December 1995. Copyright © 1995 American Institute of Physics. Used by permission.

Abstract

We present Schlieren images which show the existence and evolution of current filaments during the very early stages of surface-related breakdown inside 1 cm silicon p⁺-n^--n⁺ structures. These images confirm our previous finding that breakdown occurs in the silicon rather than in the ambient, and suggest that a streamerlike mechanism may be responsible.