Surface-related breakdown in silicon: Imaging of current filaments in long p⁺-n^--n⁺ structures

Authors

B. J. Hankla, University of Nebraska - Lincoln
P. F. Williams, University of Nebraska - LincolnFollow
G. A. Frecks, University of Nebraska - Lincoln
F. E. Peterkin, Naval Surface Warfare Center, Code B, Dahlgren, VA

Date of this Version

December 1995

Comments

Published in Appl. Phys. Lett. 67 (26), 25 December 1995. Copyright © 1995 American Institute of Physics. Used by permission.

Abstract

We present Schlieren images which show the existence and evolution of current filaments during the very early stages of surface-related breakdown inside 1 cm silicon p⁺-n^--n⁺ structures. These images confirm our previous finding that breakdown occurs in the silicon rather than in the ambient, and suggest that a streamerlike mechanism may be responsible.