Electrical & Computer Engineering, Department of
Document Type
Article
Date of this Version
6-1-1998
Abstract
Spectroscopic ellipsometry and magneto-optic Kerr effects are measured on Pt/Co multilayers with a series of Co layer thicknesses from 0.08 to 1 nm. An electromagnetic theory of multilayered structures allows regression analysis fits between acquired data and parameter dependent model analysis. Recently, we determined the single layer Co magneto-optic Voigt parameter and found that it depends on Co layer thickness. In the present work, we report an in-depth study of interfacial magneto-optic effects for a large number of Pt/Co multilayer samples. Kerr rotation and ellipticity were measured over the spectral range from 200 to 1700 nm. Voigt parameters of the magnetic layers for these Pt/Co multilayer samples with different thicknesses were compared, and the Pt–Co interface thicknesses were determined in terms of the material dielectric tensor.
Comments
Published in J. Appl. Phys., Vol. 83, No. 11, 1 June 1998. © 1998 American Institute of Physics. Used by permission.