Electrical Engineering, Department of

 

Date of this Version

2011

Citation

APPLIED PHYSICS LETTERS 99, 081903 (2011); doi:10.1063/1.3626846

Comments

Copyright 2011 American Institute of Physics

Abstract

The anisotropic optical dielectric functions of a metal (cobalt) slanted columnar thin film deposited by electron-beam glancing angle deposition are reported for the terahertz (THz) frequency domain using generalized spectroscopic ellipsometry. We employ a simple effective medium dielectric function homogenization approach to describe the observed optical response. The approach describes isolated, electrically conductive columns which render the thin film biaxial (orthorhombic). Our findings suggest controlled variability of dielectric polarizability and anisotropy in the THz spectral range by choice of geometry, material, and structure.