Optical- and magnets-optical measurements using a variable angle of incidence spectroscopic ellipsometer: Application to DyCo multilayer

Authors

William A. McGahan, University of Nebraska-Lincoln
Z. S. Shan, University of Nebraska-Lincoln
Alan M. Massengale, University of Nebraska-Lincoln
Thomas E. Tiwald, University of Nebraska-Lincoln

Document Type

Article

Date of this Version

May 1989

Comments

Published in d. Vac. scl. Technol. A 7 (3), May/June 1989. Copyright 1989 American Vacuum Society. Used by permission.

Abstract

We have extended the technique of variable angle spectroscopic ellipsometry to measurement of the magneto-optical effects as a function of wavelength and angle of incidence and field strength. Results on DyCo multilayers are reported.