Research Papers in Physics and Astronomy


Date of this Version

June 1998


Published J. Appl. Phys. 83 (1998) 7246-7248. Permission to use.


The thickness dependent spin-polarized electronic structure of strained thin and ultrathin films of Gd is characterized by a distinct change in the critical exponent λ in the formalism of finite size scaling. The reduced critical exponent in the ultrathin films can be correlated to the increased dominance of the surface magnetic structure and the increasing paramagnetic-like behavior of the bulk. ©1998 American Institute of Physics.

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