Combined Kerr microscope and magnetic force microscope for variable temperature ultrahigh vacuum investigations

Authors

D. Peterka, Max-Planck-Institute for Solid State Physics
Axel Enders, University of Nebraska-LincolnFollow
G. Haas, Max-Planck-Institute for Solid State Physics
Klaus Kern, Max-Planck-Institute for Solid State PhysicsFollow

Date of this Version

2003

Comments

Published in REVIEW OF SCIENTIFIC INSTRUMENTS, VOLUME 74, NUMBER 5 MAY 2003. DOI: 10.1063/1.1568556 © 2003 American Institute of Physics. Used by permission.

Abstract

A new system combining a Kerr microscope and a magnetic force microscope for the study of magnetic domains in ultrathin films under ultrahigh vacuum conditions is presented. Due to the overlapping imaging range of both techniques magnetic domains can be investigated over a lateral range from millimeter down to fractions of a micrometer. Experiments can be done at variable temperatures, from 80 K to 600 K. First results are presented showing the same magnetic domain in a three monolayer Fe film on Cu (100) imaged with both techniques.