Tunneling characteristics of internal josephson junctions in YBa₂Cu₃O_7-δ thin films

Authors

• W.S. Brocklesby, AT&T Bell Laboratories, Murray Hill, New Jersey
• Don Monroe, AT&T Bell Laboratories, Murray Hill, New Jersey
• M. Hong, AT&T Bell Laboratories, Murray Hill, New Jersey
• Sy_Hwang Liou, University of Nebraska-LincolnFollow
• J. Kwo, AT&T Bell Laboratories, Murray Hill, New Jersey
• G.J. Fisanick, AT&T Bell Laboratories, Murray Hill, New Jersey
• P.M. Mankiewich, AT&T Bell Laboratories, Holmdel, New Jersey
• R.E. Howard, AT&T Bell Laboratories, Holmdel, New Jersey

Document Type

Article

Date of this Version

December 1988

Comments

Published by American Physical Society. Phys. Rev. B, 38, 11805 (1988). http://prb.aps.org. Copyright © 1988 American Physical Society. Permission to use.

Abstract

We have measured detailed I-V characteristics of small areas of YBa₂Cu₃O_7-δ films, which exhibit structure associated with individual Josephson junctions within the film. Both hysteretic and nonhysteretic junctions are seen. A simple model relating the voltage steps to the junction properties is developed. The temperature dependence of l_c for the hysteretic junctions fits that predicted for quasiparticle tunneling junctions between conventional superconductors.