Noise measurement of YBa₂Cu₃O_7-χ and Ti₂Ba₂Ca₂Cu₂O_10-χ thin films

Authors

• J.P. Zheng, Department of Electrical and Computer Engineering, State University of New York at Buffalo, Bonner Hall, Amherst, New York
• Q.Y. Ying, Department of Electrical and Computer Engineering, State University of New York at Buffalo, Bonner Hall, Amherst, New York
• S.Y. Dong, Department of Electrical and Computer Engineering, State University of New York at Buffalo, Bonner Hall, Amherst, New York
• H.S. Kwok, Department of Electrical and Computer Engineering, State University of New York at Buffalo, Bonner Hall, Amherst, New York
• Sy_Hwang Liou, University of Nebraska-LincolnFollow

Document Type

Article

Date of this Version

January 1999

Comments

Published by American Institute of Physics. J. Appl. Phys. 69, 553(1991). © 1991 American Institute of Physics. Permission to use. http://jap.aip.org/jap/.

Abstract

The noise of YBa₂Cu₃O_7-χ and Ti₂Ba₂Ca₂Cu₂O_10-χ thin films in the frequency range from 0.5 Hz to 100 kHz was studied. In the normal state, it was found that 1/f noise dominated, with a magnitude strongly dependent on temperature. In the superconducting state, the noise was only observable at frequencies below 5 Hz with our present setup. Equilibrium thermal fluctuation noise was not observed in these films.