Noise measurement of YBa₂Cu₃O_7-χ and Ti₂Ba₂Ca₂Cu₂O_10-χ thin films

Authors

J.P. Zheng, Department of Electrical and Computer Engineering, State University of New York at Buffalo, Bonner Hall, Amherst, New York
Q.Y. Ying, Department of Electrical and Computer Engineering, State University of New York at Buffalo, Bonner Hall, Amherst, New York
S.Y. Dong, Department of Electrical and Computer Engineering, State University of New York at Buffalo, Bonner Hall, Amherst, New York
H.S. Kwok, Department of Electrical and Computer Engineering, State University of New York at Buffalo, Bonner Hall, Amherst, New York
Sy_Hwang Liou, University of Nebraska-LincolnFollow

Date of this Version

January 1999

Comments

Published by American Institute of Physics. J. Appl. Phys. 69, 553(1991). © 1991 American Institute of Physics. Permission to use. http://jap.aip.org/jap/.

Abstract

The noise of YBa₂Cu₃O_7-χ and Ti₂Ba₂Ca₂Cu₂O_10-χ thin films in the frequency range from 0.5 Hz to 100 kHz was studied. In the normal state, it was found that 1/f noise dominated, with a magnitude strongly dependent on temperature. In the superconducting state, the noise was only observable at frequencies below 5 Hz with our present setup. Equilibrium thermal fluctuation noise was not observed in these films.