DigitalCommons@University of Nebraska - Lincoln - Yi Liu, David J. Sellmyer, B.W. Robertson, Z.S. Shan, and Sy_Hwang Liou: High resolution electron microscopy and nano-probe study of CoSm/Cr films

Research Papers in Physics and Astronomy

Si-Hwang Liou Publications

Title

High resolution electron microscopy and nano-probe study of CoSm/Cr films

Authors

Yi Liu, University of Nebraska - Lincoln
David J. Sellmyer, University of Nebraska-Lincoln
B.W. Robertson, University of Nebraska - Lincoln
Z.S. Shan, University of Nebraska - Lincoln
Sy_Hwang Liou, University of Nebraska-Lincoln

Document Type

Article

Date of this Version

November 1995

Comments

Abstract

The crystal structure of the crystallites in CoSm thin films deposited on Cr underlayer was studied by nanodiffraction and high resolution electron microscopy (HREM). It was found that the crystallites have a closed-packed structure. Some nanodiffraction patterns taken from different crystallites using a two nanometer probe can be indexed by two layer stacking AB (HCP structure), three layer stacking ABC (FCC structure), and four layer stacking ABAC (double hexagonal structure), suggesting that a particular local stacking mode could exist. [112^-0] HREM images confirmed that stacking sequence changes within one crystallite. In local regions, random stacking, and unit cells of two layer stacking ABAC were found.

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