Research Papers in Physics and Astronomy

 

Date of this Version

October 1996

Comments

Published by American Institute of Physics. Appl. Phys. Lett., 69, 2752 (1996). Copyright 1996. Permission to use. http://jap.aip.org/jap/.

Abstract

A process combining hydrofluoric acid (HF) and Ar+ ion milling has been used to make YBa2Cu3Oχ/SrTiO3/YBa2Cu2Oχ (YBCO/STO/YBCO) multilayer test circuits. Low-angle steps can be readily etched in STO and YBCO films with this process. YBCO lines crossing 5° steps have about the same critical temperature Tc (89–90 K) and critical current density Jc (>1X106 A/cm2 at 86 K) as lines on planar surfaces. Via connections have the same Tc as other circuit components and adequate critical currents for most circuit designs.

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