Nanocomposite CoPt:C films for extremely high-density recording

Authors

M. Yu, University of Nebraska - Lincoln
Yi Liu, University of Nebraska-LincolnFollow
A. Moser, IBM Almaden Research Center, San Jose, California
D. Weller, IBM Almaden Research Center, San Jose, California
David J. Sellmyer, University of Nebraska-LincolnFollow

Document Type

Article

Date of this Version

12-20-1999

Comments

Published by American Institute of Physics. Appl. Phys. Lett. 75, 3992 (1999). ©1999 American Institute of Physics. Permission to use. http://apl.aip.org/jap/.

Abstract

Nanocomposite CoPt:C films were investigated as potential media for extremely high-density recording. An annealing temperature of over 600 °C is necessary to form nanocomposite CoPt:C films consisting of C matrix and fct CoPt nanocrystallites with grain sizes of 8–20 nm and coercivities of 3–12 kOe. Coercivity and grain size increase with increasing annealing temperature and decreasing C concentration and they are insensitive to film thickness. The average activation volumes are about 0.9×10^-18 cm³. The properties of these nanocomposite CoPt:C films can be tailored to satisfy the thermal stability, coercivity, and media noise requirements for extremely high-density recording.