Materials and Nanoscience, Nebraska Center for (NCMN)


Date of this Version

December 2004


Published in APPLIED PHYSICS LETTERS VOLUME 85, NUMBER 26. © 2004 American Institute of Physics. Used by permission.


Using scanning probe techniques, surface properties such as shear stiffness and friction can be measured with a resolution in the nanometer range. The torsional deflection or buckling of atomic force microscope cantilevers has previously been used in order to measure the lateral forces acting on the tip. This letter shows that the flexural vibration modes of cantilevers oscillating in their width direction parallel to the sample surface can also be used for imaging. These lateral cantilever modes exhibit vertical deflection amplitudes if the cantilever is asymmetric in thickness direction, e.g., by a trapezoidal cross section.