Computer Science and Engineering, Department of
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This correspondence generalizes Hayes' recent ideas for generating an optimal transition write sequence which forms the "backbone" of his algorithm for testing semiconductor RAM'S for pattern-sensitive faults. The generalization, presented in graph theoretic terms, involves two sequential steps. The first step results in assigning of a "color" to each memory cell. In the second step, each color is defined as a distinct sequence of bits representing the sequence of states assumed by the correspondingly colored cell. The constraints imposed at each step lead to interesting and general problems in graph theory: the standard graph coloring problem in the first step, and a path projection problem from a binary m-cube to a subcube in the second step. Applications to arbitrary k-cell neighborhoods, and particularly to three-cell neighborhoods are shown.
Published in IEEE TRANSACTIONS ON COMPUTERS, VOL. C-30, NO. 12, DECEMBER 1981, pp. 973-977. doi: 10.1109/TC.1981.1675737 Copyright 1981 IEEE. Used by permission.