Mechanical & Materials Engineering, Department of
Date of this Version
7-1999
Citation
Precision Engineering 23:3 (July 1999), pp. 144–154.
doi: 10.1016/S0141-6359(99)00004-5
Abstract
An iterative sampling process for dimensional measurement is presented. The strategy is based upon the use of surface normal measurement data to develop an interpolating curve between sample points. The interpolant is used to select subsequent measurement targets iteratively. The process is repeated until the measurement converges to a complete and accurate evaluation of the surface. The required sample size is proportional to part quality. The most accurate parts will require the least sample points; whereas, lower quality parts will require a greater number of total samples. The method is particularly applicable to measurement of complex surfaces with coordinate measuring machines (CMMs).
Included in
Mechanics of Materials Commons, Nanoscience and Nanotechnology Commons, Other Engineering Science and Materials Commons, Other Mechanical Engineering Commons
Comments
Copyright © 1999 Elsevier Science Inc. Used by permission.