Materials Research Science and Engineering Center

 

Date of this Version

2-13-2005

Comments

Published by American Institute of Physics. Appl. Phys. Lett. 86, 191915 (2005.). © 2005 American Institute of Physics. Permission to use. http://apl.aip.org/.

Abstract

The transformation variant of the fcc to fct transformation in FePt thin films was tailored by controlling the stresses in the thin films, thereby allowing selection of in- or out-of-plane c-axis orientation. FePt thin films were deposited at ambient temperature on several substrates with differing coefficients of thermal expansion relative to the FePt, which generated thermal stresses during the ordering heat treatment. X-ray diffraction analysis revealed preferential out-of-plane c-axis orientation for FePt films deposited on substrates with a similar coefficients of thermal expansion, and random orientation for FePt films deposited on substrates with a very low coefficient of thermal expansion, which is consistent with theoretical analysis when considering residual stresses.

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