Department of Physics and Astronomy: Publications and Other Research
Date of this Version
January 2007
Abstract
This chapter describes the principles, theoretical background, recent developments, and applications of a local probe-based technique for nondestructive highresolution ferroelectric domain imaging and manipulation-piezoresponse force microscopy (PFM). This technique has proven to be a powerful tool for the characterization of ferroelectric thin films, ceramics, and single crystals. Recent advances in application of PFM for studying a mechanism of polarization reversal at the nanoscale, domain dynamics, degradation effects, and size-dependent phenomena in ferroelectrics are reviewed in detail. Examples of using PFM for the characterization of various polar materials such as ferroelectric films, piezoelectric semiconductors, and ferroelectric relaxors are given.
Comments
Published in Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, Sergei Kalinin and Alexei Gruverman, editors, 2 volumes (New York: Springer Science+Business Media, 2007). Used by permission.