Radiation Effects on Current Field Programmable Technologies

Robert Katz, University of Nebraska - Lincoln
K. LaBel, NASA Goddard Space Flight Center, Greenbelt, MD
J.J. Wang, Actel Corporation, Sunnyvale, CA 94086
B. Cronquist, Actel Corporation, Sunnyvale, CA 94086
R. Koga, The Aerospace Corporation, LA, California 90009
S. Penzin, The Aerospace Corporation, LA, California 90009
G. Swift, Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA

Document Type Article

Published in IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOL. 44, NO. 6, DECEMBER 1997.

Abstract

Manufacturers of field programmable gate arrays (FPGAs) take different technological and architectural approaches that directly affect radiation performance. Similar technological and architectural features are used in related technologies such as programmable substrates and quick-turn application specific integrated circuits (ASICs). After analyzing current technologies and architectures and their radiation-effects implications, this paper includes extensive test data quantifying various devices’ total dose and single event susceptibilities, including performance degradation effects and temporary or permanent re-configuration faults. Test results will concentrate on recent technologies being used in space flight electronic systems and those being developed for use in the near term.
This paper will provide the first extensive study of various configuration memories used in programmable devices. Radiation performance limits and their impacts will be discussed for each design. In addition, the interplay between device scaling, process, bias voltage, design, and architecture will be explored. Lastly, areas of ongoing research will be discussed.