An Experimental Survey of Heavy Ion Induced Dielectric Rupture in Actel Field Programmable Gate Arrays (FPGAs)

Gary Swift, Jet Propulsion Laboratory, California Institute of Technology, Pasadena CA
Robert Katz, University of Nebraska - Lincoln

Document Type Article

Published in IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOL. 43, NO 3, JUNE 1996.

Abstract

Irradiations and subsequent failure analyses were performed to investigate single event dielectric rupture (SEDR) in Actel FPGAs as a function of ion LET (linear energy transfer), angle, bias, temperature, feature size, and device type. The small cross sections imply acceptably low risk for most spacecraft uses.