Department of Physics and Astronomy: Publications and Other Research
Date of this Version
September 1999
Abstract
The magnetic images of a magnetic reference sample were compared using point and thin-film magnetic force microscopy (MFM) tips. The thin film MFM tip was made by magnetron sputtering of an amorphous metal. The point MFM tip was made by an ion milling process that produces a small magnetic particle on the cantilever. Our results clearly demonstrated that the volume of magnetic material involved in the tip-sample interaction is much reduced in the case of the point tip compared to that of the thin film tips. By comparing the magnetic images of a tri-bit pattern on a magnetic reference sample, we observed an improved resolution using a point MFM tip.
Comments
IEEE Trans. on Magnetics, 35, 3989(1999). Copyright 1999. Permission to use.