Research Papers in Physics and Astronomy
Temperature and thickness dependence of coercivity and magnetization of Co/Cu and Co/Si multilayers
Date of this Version
Co/Cu and Co/Si multilayers of total thickness ~3000 Å were prepared by rf and dc magnetron sputtering. The nominal thicknesses of the individual layers were in the range of 4 to 100 Å. A large coercivity (Hc) at 10 K was observed for very thin layers of Co in Co/Cu samples, and it decreased with increase of the Co layer thickness. For very thin layers of Co in Co/Cu samples, the layer behaved superparamagnetically. Similar behavior was not to be observed in Co/Si samples. With increased substrate temperature (Ts) during deposition, Hc was also observed to increase (decrease) for Co/Cu (Co/Si) samples. Magnetization data were modeled to determine the diffusion layer thicknesses. Journal of Applied Physics is copyrighted by The American Institute of Physics.
Published by American Institute of Physics. J. Applied Physics 70, 6050 (1991). ©1991 American Institute of Physics. Permission to use. http://jap.aip.org/jap/.