Department of Physics and Astronomy: Publications and Other Research
Date of this Version
May 1984
Abstract
Measurements are reported on the electrical resistivity of highly disordered Ni-Cr-Al films between 4.2 and 300 K. X-ray diffraction measurements show the films to be crystalline with a bcc structure. Negative temperature coefficients are observed and the resistivity data above about 50 K can be fitted by the expression ρ(T)=ρ0 [1-cln(T2+Δ2)], where Δ depends on the heat treatment of the sample.
Comments
Published by American Physical Society. Phys. Rev. B 29, 5920 (1984). http://prb.aps.org. Copyright © 1984 American Physical Society. Permission to use.