Research Papers in Physics and Astronomy

 

Date of this Version

May 1984

Comments

Published by American Physical Society. Phys. Rev. B 29, 5920 (1984). http://prb.aps.org. Copyright © 1984 American Physical Society. Permission to use.

Abstract

Measurements are reported on the electrical resistivity of highly disordered Ni-Cr-Al films between 4.2 and 300 K. X-ray diffraction measurements show the films to be crystalline with a bcc structure. Negative temperature coefficients are observed and the resistivity data above about 50 K can be fitted by the expression ρ(T)=ρ0 [1-cln(T22)], where Δ depends on the heat treatment of the sample.

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