Effects of layer thickness on orientation distribution and magnetic properties of CoCrTa/Cr films

Authors

• Z. S. Shan, HMT Technology Corporation
• H. Zeng, Center for Materials Research and Analysis, University of Nebraska, Lincoln
• C. X. Zhu, HMT Technology Corporation,
• M. Azarisooreh, HMT Technology Corporation,
• K. Honardoost, HMT Technology Corporation,
• Yi Liu, Center for Materials Research and Analysis, University of Nebraska, LincolnFollow
• David J. Sellmyer, University of Nebraska, LincolnFollow

Document Type

Article

Date of this Version

Spring 4-15-1999

Comments

JOURNAL OF APPLIED PHYSICS VOLUME 85, NUMBER 8 15 APRIL 1999 © 1999 American Institute of Physics. @S0021-8979~99!60608-9#