Effects of layer thickness on orientation distribution and magnetic properties of CoCrTa/Cr films

Authors

Z. S. Shan, HMT Technology Corporation
H. Zeng, Center for Materials Research and Analysis, University of Nebraska, Lincoln
C. X. Zhu, HMT Technology Corporation,
M. Azarisooreh, HMT Technology Corporation,
K. Honardoost, HMT Technology Corporation,
Yi Liu, Center for Materials Research and Analysis, University of Nebraska, LincolnFollow
David J. Sellmyer, University of Nebraska, LincolnFollow

Document Type

Article

Date of this Version

Spring 4-15-1999

Comments

JOURNAL OF APPLIED PHYSICS VOLUME 85, NUMBER 8 15 APRIL 1999 © 1999 American Institute of Physics. @S0021-8979~99!60608-9#