Computer Science and Engineering, Department of
Date of this Version
1988
Abstract
Motivated by the recent advances in fast fault simulation techniques for large combinational circuits, a panel discussion has been organized for the 1988 International Test Conference. This paper is a collective account of the position statements offered by the panelists.
Comments
Published in Proceedings. New Frontiers in Testing, International Test Conference, 1988. Copyright © 1988 IEEE. Used by permission. doi: 10.1109/TEST.1988.207796.