Computer Science and Engineering, Department of

 

Document Type

Article

Date of this Version

1988

Comments

Published in Proceedings. New Frontiers in Testing, International Test Conference, 1988. Copyright © 1988 IEEE. Used by permission. doi: 10.1109/TEST.1988.207796.

Abstract

Motivated by the recent advances in fast fault simulation techniques for large combinational circuits, a panel discussion has been organized for the 1988 International Test Conference. This paper is a collective account of the position statements offered by the panelists.

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