Efficient RTL Coverage Metric for Functional Test Selection

Authors

Jian Kang, University of Nebraska-LincolnFollow
Sharad C. Seth, University of Nebraska-LincolnFollow
Vijay Gangaram, Intel CorporationFollow

Date of this Version

2007

Comments

Published in 25th IEEE VLSI Test Symmposium (VTS'07) Copyright © 2007 IEEE. Used by permission.

Abstract

For performance-critical microprocessors, efficient test-selection methods are needed for reusing a subset of functional validation tests to detect manufacturing defects. Our new input/output transition fault-coverage metric (TRIO) at the register-transfer level is shown to perform much better than current metric in test selection at only an incrementally higher computational cost. TRIO may also be used for testability analysis early in the design cycle.