Electrical & Computer Engineering, Department of
Document Type
Article
Date of this Version
12-11-1989
Abstract
Enhanced Kerr rotation spectra are measured in thin magnetic layers on silver. Also, variable angle of incidence spectroscopic ellipsometry is employed to measure the optical dielectric function of both the thin magnetic layer and the underlying thick silver layer. These results are explained quantitatively using the electromagnetic theory for reflection of light from multiple layers of isotropic and gyrotropic materials.
Comments
Published in Applied Physics Letters (December 11, 1989), Volume 55, Issue 24, pp. 2479-2481. Copyright The American Institute of Physics. Used by permission.