Research Papers in Physics and Astronomy

 

Date of this Version

11-5-2001

Comments

Published Applied Physics Letters 79 (2001) 3122-3124. Permission to use.

Abstract

Using photoemission and inverse photoemission, we have been able to characterize the Cr2O3 oxide surface of CrO2 thin films. The Cr2O3 surface oxide exhibits a band gap of about 3 eV, although the bulk CrO2 is conducting. The thickness of this insulating Cr2O3 layer is twice the photoelectron escape depth which is about 2 nm thick. The effective Cr2O3 surface layer Debye temperature, describing motion normal to the surface, is about 370 K. From a comparison of CrO2 films grown by different techniques, with different Cr2O3 content, evidence is provided that the CrO2 may polarize the Cr2O3. © 2001 American Institute of Physics. [DOI: 10.1063/1.1416474]

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