Polarization imaging in ferroelectric polymer thin film capacitors by pyroelectric scanning microscopy

Authors

Jingfeng Song, University of Nebraska-LincolnFollow
Haidong Lu, University of Nebraska-LincolnFollow
Alexei Gruverman, University of Nebraska-LincolnFollow
Stephen Ducharme, University of Nebraska-LincolnFollow

Date of this Version

5-2014

Citation

APPLIED PHYSICS LETTERS 104, 192901 (2014); doi: 10.1063/1.4875960

Comments

Copyright (c) 2014 AIP Publishing LLC. Used by permission.

Abstract

A Pyroelectric Scanning Microscopy system, which uses laser-induced thermal modulation for mapping the pyroelectric response, has been used to image a bipolar domain pattern in a ferroelectric polymer thin film capacitor. This system has achieved a resolution of 660±28 nm by using a violet laser and high f-number microscope objective to reduce the optical spot size, and by operating at high modulation frequencies to reduce the thermal diffusion length. The results agree well with a thermal model implemented numerically using finite element analysis.