Department of Physics and Astronomy: Individual Faculty Pages
Alexei Gruverman Publications
Accessibility Remediation
If you are unable to use this item in its current form due to accessibility barriers, you may request remediation through our remediation request form.
Document Type
Article
Date of this Version
11-18-1996
Citation
Applied Physics Letters (November 1996) 69(21)
Abstract
Scanning force microscopy has been used to perform a comparative nanoscale study of domain structures and switching behavior of Pb(ZrxTi1-x)O3 (PZT) thin films integrated into heterostructures with different electrodes. The study revealed a significant difference between polarization state of as-deposited PZT films on RuO2 and Pt electrodes. The PZT/RuO2 films exhibit polydomain crystallites and show almost symmetric switching behavior, while the PZT/Pt films are mainly in a single polarity state and exhibit highly asymmetric piezoelectric hysteresis loops. Formation of unswitchable polarization within the grains of submicron size as a result of fatigue process was directly observed.
Comments
Copyright © 1996, American Institute of Physics. Used by permission