Department of Physics and Astronomy: Publications and Other Research
Date of this Version
12-15-1997
Abstract
We report results on the direct observation of the microscopic origins of backswitching in ferroelectric thin films. The piezoelectric response generated in the film by a biased atomic force microscope tip was used to obtain static and dynamic piezoelectric images of individual grains in a polycrystalline material. We demonstrate that polarization reversal occurs under no external field (i.e., loss of remanent polarization) via a dispersive continuous-time random walk process, identified by a stretched exponential decay of the remanent polarization.
Comments
Published in Appl. Phys. Lett. 71 (24), 15 December 1997 0003-6951/97/71(24)/3492/3/$10.00. Copyright © 1997 American Institute of Physics. Used by permission.