High temperature superconducting Josephson junctions in a stacked bicrystal geometry

Authors

• H.Q. Li, National Institute of Standard and Technology (NIST), Boulder, Colorado
• R.H. Ono, National Institute of Standard and Technology (NIST), Boulder, Colorado
• L.R. Vale, National Institute of Standard and Technology (NIST), Boulder, Colorado
• D.A. Rudman, National Institute of Standard and Technology (NIST), Boulder, Colorado
• Sy_Hwang Liou, University of Nebraska-LincolnFollow

Document Type

Article

Date of this Version

August 1997

Comments

Published by American Institute of Physics. Appl. Phys. Lett. 71, 1121(1997). © 1997 American Institute of Physics. Permission to use. http://jap.aip.org/jap/.

Abstract

Bicrystal grain boundary Josephson junctions were fabricated in a stack of two layers of YBa₂Cu₃O_χ separated by epitaxial SrTiO₃. Weak link behavior was observed in the bridges formed in both layers that had similar shunted-junction characteristics but significantly different critical currents. Characteristic voltages up to 1.9 mV were measured at 4.5 K. The resonant structure was seen in the current–voltage characteristics of the upper-layer junctions, and interactions between junctions in the two layers were evident.