Research Papers in Physics and Astronomy


Date of this Version



Published in Microsc. Microanal. (Suppl. 2), 2002. Copyright ©Microscopy Society of America 2002. Used by permission.


The great strength of transmission electron microscope (TEM) is its capability to access to both real space (imaging) and reciprocal space (diffraction). Selected reflection imaging (SRI) can relate the diffraction of nanostructured materials with the image, providing information otherwise not possible. The experimental set up of SRI is given by Liu and Sellmyer [I]. In this paper we present some new measurements on nanocomposite magnetic materials.