Department of Physics and Astronomy: Individual Faculty Pages
David Sellmyer Publications
Accessibility Remediation
If you are unable to use this item in its current form due to accessibility barriers, you may request remediation through our remediation request form.
Document Type
Article
Date of this Version
2002
Abstract
The great strength of transmission electron microscope (TEM) is its capability to access to both real space (imaging) and reciprocal space (diffraction). Selected reflection imaging (SRI) can relate the diffraction of nanostructured materials with the image, providing information otherwise not possible. The experimental set up of SRI is given by Liu and Sellmyer [I]. In this paper we present some new measurements on nanocomposite magnetic materials.
Comments
Published in Microsc. Microanal. (Suppl. 2), 2002. Copyright ©Microscopy Society of America 2002. Used by permission.