Selected Reflection Imaging: A Useful Tool for Imaging Nanocomposite Magnetic Materials

Authors

Yi Liu, University of Nebraska-LincolnFollow
Y. Qiang, University of Nebraska - LincolnFollow
M. Yu, University of Nebraska - Lincoln
J. Ping Liu, University of Nebraska-LincolnFollow
David J. Sellmyer, University of Nebraska-LincolnFollow

Document Type

Article

Date of this Version

2002

Comments

Published in Microsc. Microanal. (Suppl. 2), 2002. Copyright ©Microscopy Society of America 2002. Used by permission.

Abstract

The great strength of transmission electron microscope (TEM) is its capability to access to both real space (imaging) and reciprocal space (diffraction). Selected reflection imaging (SRI) can relate the diffraction of nanostructured materials with the image, providing information otherwise not possible. The experimental set up of SRI is given by Liu and Sellmyer [I]. In this paper we present some new measurements on nanocomposite magnetic materials.