Techniques for Consecutive TEM and Atom Probe Tomography Analysis of Nanowires

Authors

D. R. Diercks, University of North Texas
B. P. Gorman, Colorado School of Mines
Chin Li Cheung, University of Nebraska at LincolnFollow
G. Wang, University of Nebraska at Lincoln

Document Type

Article

Date of this Version

2009

Comments

Published in Microsc Microanal 15(Suppl 2), 2009. Copyright 2009 Microscopy Society of America. Used by permission.

Abstract

Nanowires show great promise for development in many technological applications including electronics, photonics, and displays . Due to the fine scale of nanowires, transmission electron microscopy (TEM) and atom probe tomography (APT) are among a limited number of techniques that can measure the crystallographic and chemical nature of these structures which ultimately define their performance.