Center, Materials and Nanoscience, Nebraska Center for

 

Nebraska Center for Materials and Nanoscience: Faculty Publications

Revisiting Calculation of Tilt Angles for Double-Tilt Sample Holders in Transmission Electron Microscopes

ORCID IDs

Li https://orcid.org/0000-0001-8466-4020

Document Type

Article

Date of this Version

6-2024

Citation

Microscopy Research & Technique (2024) 87(11): 2681–2686

doi: 10.1002/jemt.24640

Comments

Open access

License: CC BY 4.0 International

Abstract

We revisited the formula related to the overall tilt angle of a specimen using a side-entry double-tilt sample holder in a transmission electron microscope. Initially, we examined existing formulas in the literature for calculating the overall tilt angle. Subsequently, a new formula was derived, proven to better account for the actions of the double-tilt holder, thereby providing improved accuracy in the calculation. This newly derived formula has been implemented in the Landyne software suite. Furthermore, we demonstrated the accuracy of the new formula through examples.

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