Computer Science and Engineering, Department of


Date of this Version



Published in IEEE TRANSACTIONS ON COMPUTERS, VOL. 39, NO. 4, APRIL 1990, pp. 582-586. Copyright 1990 IEEE. Used by permission.


When test vectors are applied to a circuit, the fault coverage increases. The rate of increase, however, could be circuit dependent. A relation between the average fault coverage and circuit testability is developed in this paper. The statistical formulation allows computation of coverage for deterministic and random vectors. We discuss the following applications of this analysis: determination of circuit testability from fault simulation, coverage prediction from testability analysis, prediction of test length, and test generation by fault sampling.