Computing, School of
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Document Type
Article
Date of this Version
1989
Abstract
Bounds on test sequence length can be used as a testability measure. We give a procedure to compute the upper bound on test sequence length for an arbitrary sequential circuit. We prove that the bound is exact for a certain class of circuits. Three design rules are specified to yield circuits with lower test sequence bounds.
Comments
Published in Proceedings. Meeting the Tests of Time., International Test Conference, 1989. Copyright © 1989 IEEE. Used by permission. doi: 10.1109/TEST.1989.82320.