"Parallel Test Generation With Low Communication Overhead" by Sivaramakrishnan Venkatraman, Sharad C. Seth et al.

Computer Science and Engineering, Department of

 

Date of this Version

1995

Comments

Published in Proceedings of the 8th International Conference on VLSI Design, 1995. doi: 10.1109/ICVD.1995.512088 Copyright 1995 IEEE. Used by permission.

Abstract

In this paper we present a method of parallelizing test generation for combinational logic using boolean satisfiability. We propose a dynamic search-space allocation strategy to split work between the available processors. This strategy is easy to implement with a greedy heuristic and is economical in its demand for inter-processor communication. We derive an analytical model to predict the performance of the parallel versus sequential implementations. The effectiveness of our method and analysis is demonstrated by an implementation on a Sequent (shared memory) multiprocessor. The experimental data shows significant performance improvement in parallel implementation, validates our analytical model, and allows predictions of performance for a range of time-out limits and degrees of parallelism.

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