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INTERNAL REFLECTION ELLIPSOMETRY OF LIQUID-LIQUID INTERFACES.
Abstract
The mathematical framework of internal reflection ellipsometry for various models applicable to characteriz- ation of the thickness and anisotropy of liquid-liquid interfaces is presented. The alignment and calibration procedures, which are different and more difficult to imp- lement than those used for external ellipsometric study of solids, are also presented. Internal reflection ellipsometric measurements on the H2O-air, CC14-air and CC14-H20 inter- faces are consistent with the presence of an interface tran-. sition layer, an area of long-standing interest and debate in the physics and chemistry of interfaces. Initial ex- perimental results on CC14-H20 indicate that the relative amounts of the two constituents and the ambient temperature are of major importance in determining the magnitude of the expected anisotropy at the interface. A phenomenological model for the anistropy is proposed based on multiple re- flections in a uniaxial interface layer whose optic axis is perpendicular to the interface.
Subject Area
Optics
Recommended Citation
AYOUB, GEORGE TANIOS, "INTERNAL REFLECTION ELLIPSOMETRY OF LIQUID-LIQUID INTERFACES." (1976). ETD collection for University of Nebraska-Lincoln. AAI7625856.
https://digitalcommons.unl.edu/dissertations/AAI7625856