Electrical and Computer Engineering, Department of
P. F. (Paul Frazer) Williams Publications
Accessibility Remediation
If you are unable to use this item in its current form due to accessibility barriers, you may request remediation through our remediation request form.
Document Type
Article
Date of this Version
February 1996
Abstract
We have used a modified Schlieren technique to photograph current filaments formed inside silicon during the very early stages of surface-related breakdown. We believe that the features we see are due to heating in the filamentary channel. The very rapid formation of these channels suggests that they result from streamer-like phenomena in the bulk silicon.
Comments
Published in IEEE TRANSACTIONS ON PLASMA SCIENCE, VOL. 24, NO. 1, FEBRUARY 1996. Copyright © 1996 IEEE. Used by permission.