Electrical and Computer Engineering, Department of
P. F. (Paul Frazer) Williams Publications
Document Type
Article
Date of this Version
February 1996
Abstract
We have used a modified Schlieren technique to photograph current filaments formed inside silicon during the very early stages of surface-related breakdown. We believe that the features we see are due to heating in the filamentary channel. The very rapid formation of these channels suggests that they result from streamer-like phenomena in the bulk silicon.
Comments
Published in IEEE TRANSACTIONS ON PLASMA SCIENCE, VOL. 24, NO. 1, FEBRUARY 1996. Copyright © 1996 IEEE. Used by permission.